AZtecCrystal 4.0: Advanced EBSD Data Processing Software

AZtecCrystal 4.0 is the latest generation of Oxford Instruments' electron backscatter diffraction (EBSD) analysis software, designed for processing high-speed EBSD data from modern CMOS detectors . This version introduces two new features that enhance researchers' ability to evaluate and visualize complex EBSD datasets .

Key New Features in Version 4.0

Crystal Batch

• Batch Processing: Apply all of AZtecCrystal's processing power to hundreds of map layers in a single step

• External Parameter Linking: Synchronize EBSD metrics with external experimental parameters (temperature, load, extension) across multiple datasets

• Ideal Applications: 3D FIB slice analysis, in-situ experiments, quality control, and multi-sample workflows

Crystal Compare

• Data Stack Visualization: View and compare stacked datasets dynamically

• Experimental Parameter Linking: Connect experimental parameters to individual map layers for the first time

• Time-Lapse Creation: Generate video imagery to visualize dynamic changes across datasets

STAMP Tool

• Third-Party Data Integration: Add external data to raw H5OINA files automatically using filename information or manual import