EDAX OIM Analysis 9.1: Comprehensive EBSD Data Analysis Software

OIM Analysis 9.1 is the latest version of EDAX's industry-leading software for electron backscatter diffraction (EBSD) data analysis and microstructure characterization . It introduces a new ribbon-style interface, one-click Auto Analyze functionality, customizable analysis templates, and spherical indexing via OIM Matrix .

Key New Features in Version 9.1

Redesigned User Interface & One-Click Analysis

• Ribbon Bar Layout: New intuitive interface familiar to common software applications, reducing learning curve for both new and existing users

• Auto Analyze Button: One-click generation of essential EBSD outputs including IPF orientation maps, image quality maps, phase maps, grain maps, and grain size distribution

• Immediate Results: Provides instant summary of measured microstructure to guide subsequent analysis

Customizable Analysis Templates

• User-Defined Templates: Add desired maps, plots, and charts to project tree; specify color scales and angular ranges

• Save & Share: Templates can be saved, reused, or shared with other OIM Analysis users

• Extended One-Click: Add custom templates to Auto Analysis button for fast, consistent, repeatable analysis across similar samples

OIM Matrix with Spherical Indexing

• Enhanced Indexing: Spherical indexing projects experimental patterns over spherical surface of simulated master pattern for improved orientation determination

• Challenging Materials: Superior indexing performance for materials difficult to analyze with traditional Hough-based methods

• Orientation Refinement: Optimizes orientation by fitting collected patterns to master pattern, improving precision

• Experimental Master Patterns: Create master patterns from saved experimental patterns in ~30 seconds (vs minutes for dynamical diffraction), capturing true pattern intensities

Advanced Microstructure Analysis

• Subgrain Structure Visualization: Local orientation spread (LOS) and kernel average misorientation (KAM) maps reveal subgrain boundaries and structure developed during processing

• High Orientation Precision: Better than 0.01° resolution for deformed microstructures

• Interactive Analysis: Link maps and charts to query, visualize, and measure key microstructure features

Chi-Scan for EDS-EBSD Integration

• Multi-Phase Identification: Simultaneous analysis of EDS and EBSD data eliminates mislabeling between phases with similar crystal structures

NPAR & PRIAS

• NPAR (Neighbor Pattern Averaging and Re-indexing): Improves pattern indexing for previously unidentifiable patterns

• PRIAS: Provides orientation, atomic number, and topographic contrast without additional hardware